Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. An AFM probe has a sharp tip on the free-swinging end of a cantilever that is protruding from a holder. The dimensions of the cantilever are in the scale of micrometers. The radius of the tip is usually on the scale of a few nanometers to a few tens of nanometers.
Table of Contents 1 Market Overview 1.1 AFM Probe Introduction 1.2 Market Analysis by Type 1.2.1 Silicon AFM Probes 1.2.2 Silicon Nitride AFM Probes 1.2.3 Diamond AFM Probes 1.2.4 Others 1.3 Market Analysis by Applications 1.3.1 Life Sciences and Biology 1.3.2 Materials 1.3.3 Semiconductors and Electronics 1.3.4 Others